The development of temperature-dependent macromodels for digital IC ports is addressed. The proposed modeling approach is based on the theory of discrete-time parametric models and allows one to estimate the model parameters from voltage and current waveforms observed at the ports and to implement the model as a SPICE subcircuit. The proposed technique is validated by applying it to commercial devices described by detailed transistor-level models. The obtained models perform at a good accuracy level and are more efficient than the original transistor-level models.
Behavioral Modeling of IC Ports Including Temperature Effects / Stievano, IGOR SIMONE; Becker, D.; Canavero, Flavio; Chen, Z; Katopis, G.; Maio, Ivano Adolfo. - STAMPA. - (2002), pp. 333-336. (Intervento presentato al convegno Electrical Performance of Electronic Packaging, 2002 tenutosi a Monterey, CA, (USA) nel Oct. 21-23, 2002) [10.1109/EPEP.2002.1057944].
Behavioral Modeling of IC Ports Including Temperature Effects
STIEVANO, IGOR SIMONE;CANAVERO, Flavio;MAIO, Ivano Adolfo
2002
Abstract
The development of temperature-dependent macromodels for digital IC ports is addressed. The proposed modeling approach is based on the theory of discrete-time parametric models and allows one to estimate the model parameters from voltage and current waveforms observed at the ports and to implement the model as a SPICE subcircuit. The proposed technique is validated by applying it to commercial devices described by detailed transistor-level models. The obtained models perform at a good accuracy level and are more efficient than the original transistor-level models.File | Dimensione | Formato | |
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https://hdl.handle.net/11583/1409388
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