statistiche ricercatore

Nazione	#
US - Stati Uniti d'America	704
IT - Italia	373
VN - Vietnam	300
SG - Singapore	264
CN - Cina	166
RU - Federazione Russa	152
DE - Germania	150
FI - Finlandia	71
FR - Francia	53
KR - Corea	53
HK - Hong Kong	45
BR - Brasile	41
GB - Regno Unito	27
IN - India	27
BE - Belgio	22
BD - Bangladesh	18
IE - Irlanda	18
AT - Austria	16
IL - Israele	16
TR - Turchia	15
CA - Canada	11
PH - Filippine	9
TH - Thailandia	9
ID - Indonesia	8
PL - Polonia	8
EC - Ecuador	7
JP - Giappone	7
NL - Olanda	7
RO - Romania	7
JO - Giordania	6
BG - Bulgaria	5
CH - Svizzera	4
EG - Egitto	4
IQ - Iraq	4
SE - Svezia	4
AR - Argentina	3
LT - Lituania	3
MO - Macao, regione amministrativa speciale della Cina	3
MX - Messico	3
ZA - Sudafrica	3
IR - Iran	2
KE - Kenya	2
MA - Marocco	2
PK - Pakistan	2
TW - Taiwan	2
UZ - Uzbekistan	2
VE - Venezuela	2
AE - Emirati Arabi Uniti	1
BW - Botswana	1
BY - Bielorussia	1
CR - Costa Rica	1
CU - Cuba	1
CZ - Repubblica Ceca	1
GE - Georgia	1
KW - Kuwait	1
MD - Moldavia	1
MN - Mongolia	1
NI - Nicaragua	1
NO - Norvegia	1
QA - Qatar	1
RS - Serbia	1
SK - Slovacchia (Repubblica Slovacca)	1
SN - Senegal	1
TN - Tunisia	1
TT - Trinidad e Tobago	1
Totale	2.678

Nome	#
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test	361
Test and diagnosis of memories embedded in Automotive SoCs	241
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip	234
Industrial best practice: cases of study by automotive chip- makers	224
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs	223
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements	219
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements	212
Recent Trends and Perspectives on Defect-Oriented Testing	203
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs	185
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests	183
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip	166
ARBoard: Augmented Reality for PCB Operations in Industry 5.0	134
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories	93
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis	49
Totale	2.727

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2021/2022	71	0	0	0	0	16	8	3	7	1	2	26	8
2022/2023	93	4	6	22	7	10	17	2	4	10	5	2	4
2023/2024	179	24	16	10	13	19	27	23	6	5	4	15	17
2024/2025	624	3	49	30	68	31	63	95	79	86	22	24	74
2025/2026	1.760	59	51	105	115	127	84	235	162	356	217	60	189
Totale													2.727

PORTO @ Archivio Istituzionale della Ricerca