statistiche ricercatore

Continente	#
NA - Nord America	1.440
AS - Asia	975
EU - Europa	956
SA - Sud America	53
Continente sconosciuto - Info sul continente non disponibili	49
AF - Africa	14
Totale	3.487

Nazione	#
US - Stati Uniti d'America	1.414
IT - Italia	396
VN - Vietnam	300
SG - Singapore	266
CN - Cina	167
RU - Federazione Russa	152
DE - Germania	150
FI - Finlandia	71
KR - Corea	55
FR - Francia	53
HK - Hong Kong	46
BR - Brasile	41
GB - Regno Unito	32
IN - India	30
BE - Belgio	22
BD - Bangladesh	20
IE - Irlanda	18
AT - Austria	16
IL - Israele	16
TR - Turchia	15
CA - Canada	13
PH - Filippine	9
TH - Thailandia	9
ID - Indonesia	8
PL - Polonia	8
EC - Ecuador	7
JP - Giappone	7
NL - Olanda	7
RO - Romania	7
JO - Giordania	6
SE - Svezia	6
BG - Bulgaria	5
IQ - Iraq	5
CH - Svizzera	4
EG - Egitto	4
AR - Argentina	3
LT - Lituania	3
MO - Macao, regione amministrativa speciale della Cina	3
MX - Messico	3
TT - Trinidad e Tobago	3
ZA - Sudafrica	3
IR - Iran	2
KE - Kenya	2
MA - Marocco	2
PK - Pakistan	2
TW - Taiwan	2
UZ - Uzbekistan	2
VE - Venezuela	2
AE - Emirati Arabi Uniti	1
BB - Barbados	1
BW - Botswana	1
BY - Bielorussia	1
CR - Costa Rica	1
CU - Cuba	1
CZ - Repubblica Ceca	1
GE - Georgia	1
JM - Giamaica	1
KW - Kuwait	1
MD - Moldavia	1
MN - Mongolia	1
NI - Nicaragua	1
NO - Norvegia	1
PR - Porto Rico	1
QA - Qatar	1
RS - Serbia	1
SK - Slovacchia (Repubblica Slovacca)	1
SN - Senegal	1
SV - El Salvador	1
TN - Tunisia	1
Totale	3.438

Nome	#
Test and diagnosis of memories embedded in Automotive SoCs	870
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test	364
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs	258
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip	238
Industrial best practice: cases of study by automotive chip- makers	227
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements	223
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements	218
Recent Trends and Perspectives on Defect-Oriented Testing	208
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs	203
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests	189
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip	168
ARBoard: Augmented Reality for PCB Operations in Industry 5.0	154
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories	101
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis	66
Totale	3.487

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2021/2022	71	0	0	0	0	16	8	3	7	1	2	26	8
2022/2023	93	4	6	22	7	10	17	2	4	10	5	2	4
2023/2024	179	24	16	10	13	19	27	23	6	5	4	15	17
2024/2025	624	3	49	30	68	31	63	95	79	86	22	24	74
2025/2026	1.763	59	51	105	115	127	84	235	162	356	217	60	192
2026/2027	757	695	62	0	0	0	0	0	0	0	0	0	0
Totale													3.487

PORTO @ Archivio Istituzionale della Ricerca