statistiche ricercatore

Continente	#
NA - Nord America	1.677
EU - Europa	1.011
AS - Asia	990
SA - Sud America	58
Continente sconosciuto - Info sul continente non disponibili	49
AF - Africa	14
Totale	3.799

Nazione	#
US - Stati Uniti d'America	1.620
IT - Italia	426
VN - Vietnam	300
SG - Singapore	266
CN - Cina	167
RU - Federazione Russa	152
DE - Germania	150
FI - Finlandia	71
KR - Corea	56
FR - Francia	53
HK - Hong Kong	47
BR - Brasile	41
GB - Regno Unito	38
IN - India	32
CA - Canada	30
BD - Bangladesh	22
BE - Belgio	22
IE - Irlanda	19
IL - Israele	18
SE - Svezia	18
AT - Austria	16
TR - Turchia	16
PH - Filippine	9
TH - Thailandia	9
EC - Ecuador	8
ID - Indonesia	8
JP - Giappone	8
PL - Polonia	8
RO - Romania	8
NL - Olanda	7
JO - Giordania	6
TT - Trinidad e Tobago	6
BG - Bulgaria	5
CR - Costa Rica	5
IQ - Iraq	5
CH - Svizzera	4
EG - Egitto	4
AR - Argentina	3
BB - Barbados	3
CO - Colombia	3
HN - Honduras	3
LT - Lituania	3
MO - Macao, regione amministrativa speciale della Cina	3
MX - Messico	3
TW - Taiwan	3
ZA - Sudafrica	3
EE - Estonia	2
IR - Iran	2
IS - Islanda	2
KE - Kenya	2
MA - Marocco	2
PK - Pakistan	2
QA - Qatar	2
UZ - Uzbekistan	2
VE - Venezuela	2
AE - Emirati Arabi Uniti	1
AL - Albania	1
BW - Botswana	1
BY - Bielorussia	1
CU - Cuba	1
CZ - Repubblica Ceca	1
GE - Georgia	1
GP - Guadalupe	1
JM - Giamaica	1
KW - Kuwait	1
MD - Moldavia	1
MN - Mongolia	1
MQ - Martinica	1
MY - Malesia	1
NI - Nicaragua	1
NO - Norvegia	1
PR - Porto Rico	1
PS - Palestinian Territory	1
PY - Paraguay	1
RS - Serbia	1
SA - Arabia Saudita	1
SK - Slovacchia (Repubblica Slovacca)	1
SN - Senegal	1
SV - El Salvador	1
TN - Tunisia	1
Totale	3.750

Nome	#
Test and diagnosis of memories embedded in Automotive SoCs	913
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test	377
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs	280
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip	253
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements	252
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements	246
Industrial best practice: cases of study by automotive chip- makers	242
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs	228
Recent Trends and Perspectives on Defect-Oriented Testing	220
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests	205
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip	187
ARBoard: Augmented Reality for PCB Operations in Industry 5.0	181
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories	127
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis	88
Totale	3.799

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2021/2022	71	0	0	0	0	16	8	3	7	1	2	26	8
2022/2023	93	4	6	22	7	10	17	2	4	10	5	2	4
2023/2024	179	24	16	10	13	19	27	23	6	5	4	15	17
2024/2025	624	3	49	30	68	31	63	95	79	86	22	24	74
2025/2026	1.763	59	51	105	115	127	84	235	162	356	217	60	192
2026/2027	1.069	695	74	98	174	28	0	0	0	0	0	0	0
Totale													3.799

PORTO @ Archivio Istituzionale della Ricerca