DI GRUTTOLA GIARDINO, NICOLA
 Distribuzione geografica
Continente #
AS - Asia 369
EU - Europa 356
NA - Nord America 150
SA - Sud America 35
AF - Africa 6
Totale 916
Nazione #
IT - Italia 217
SG - Singapore 163
US - Stati Uniti d'America 148
CN - Cina 114
HK - Hong Kong 37
DE - Germania 33
KR - Corea 32
BR - Brasile 30
FR - Francia 30
BE - Belgio 16
AT - Austria 12
NL - Olanda 11
FI - Finlandia 10
IL - Israele 9
GB - Regno Unito 7
RU - Federazione Russa 6
TR - Turchia 6
IE - Irlanda 4
CO - Colombia 3
ES - Italia 3
IN - India 3
ZA - Sudafrica 3
BD - Bangladesh 2
CA - Canada 2
CZ - Repubblica Ceca 2
AL - Albania 1
CL - Cile 1
EC - Ecuador 1
EG - Egitto 1
GE - Georgia 1
ID - Indonesia 1
LT - Lituania 1
MA - Marocco 1
NO - Norvegia 1
PL - Polonia 1
RO - Romania 1
TN - Tunisia 1
VN - Vietnam 1
Totale 916
Città #
Turin 114
Singapore 88
Ashburn 31
Seoul 30
Hefei 26
Milan 19
Dallas 18
Beijing 17
Santa Clara 17
Brussels 16
Hong Kong 14
Boardman 11
Shanghai 10
Vienna 9
Frankfurt am Main 8
Munich 7
Naples 7
Rome 7
Helsinki 6
Ivrea 6
Los Angeles 6
Nuremberg 6
Paris 6
Tel Aviv 6
Borgosesia 5
Cinisello Balsamo 5
Istanbul 5
Amsterdam 4
Buffalo 4
Collegno 4
Dublin 4
Falkenstein 4
Guangzhou 4
São Paulo 4
Bologna 3
Central 3
Council Bluffs 3
Denver 3
Genoa 3
Jerusalem 3
Loudi 3
Redondo Beach 3
Shenzhen 3
Tongling 3
Albanella 2
Belo Horizonte 2
Cangzhou 2
Cartagena 2
Giulianova 2
Grenoble 2
Houston 2
Kissing 2
Lappeenranta 2
Lorient 2
Madison 2
Moncalieri 2
San Cipriano d'Aversa 2
Seattle 2
Tsing Yi Town 2
Turku 2
Alexandria 1
Ankara 1
Aryanah 1
Atlanta 1
Atwater 1
Baxley 1
Bexley 1
Camaquã 1
Campinas 1
Capaccio 1
Cape Town 1
Chennai 1
Chicago 1
Cleveland 1
Conselheiro Lafaiete 1
Cotia 1
Dronero 1
Duque de Caxias 1
Durban 1
Felitto 1
Florence 1
Grayson 1
Hangzhou 1
Hưng Yên 1
Ibatiba 1
Isola Rizza 1
Itapecerica 1
Jakarta 1
Johannesburg 1
Joinville 1
Juiz de Fora 1
Lapa 1
Lauro de Freitas 1
London 1
Longueuil 1
Luziânia 1
Manassas 1
Manchester 1
Mappano 1
Marrakesh 1
Totale 630
Nome #
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems 159
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 142
A guided debugger-based fault injection methodology for assessing functional test programs 120
A System-Level Test Methodology for Communication Peripherals in System-on-Chips 119
A Modular Avionics Architecture for a Planetary Rover Demonstrator for Human Assistance 114
ARDITO, a modular technology demonstrator for robotic planetary surface exploration and operational support: an overview 105
From design to delivery in three months: the fast development of a 3U CubeSat 95
Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs 92
A Novel Tester-Based Approach for Functional Testing of Hardware Timers 9
HW/SW Co-Design of a Reliable Deep Space System exploiting Application-profiled RAM Scrubbing 2
Totale 957
Categoria #
all - tutte 2.798
article - articoli 487
book - libri 0
conference - conferenze 2.311
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.596


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202480 18 7 3 1 9 16 2 3 5 7 6 3
2024/2025576 0 31 46 48 69 35 25 43 53 64 76 86
2025/2026301 81 75 67 78 0 0 0 0 0 0 0 0
Totale 957