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Electrical characterization of self-aligned titanium silicide SBDs formed by furnace annealing
2010 Barbarini, Elena; Ferrero, Sergio; Pirri, Candido
Furnace annealing effects in the formation of titanium silicide Schottky barriers
2010 Barbarini, Elena; Guastella, SALVATORE ANTONIO; Pirri, Candido
Structural and chemical analysis of self-aligned titanium silicide formed by furnace annealing
2010 Barbarini, Elena; Guastella, SALVATORE ANTONIO; Pirri, Candido
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Electrical characterization of self-aligned titanium silicide SBDs formed by furnace annealing / Barbarini, E., Ferrero, S., Pirri, C.. - (2010). (Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference 15-17 dec 2010). | 1-gen-2010 | BARBARINI, ELENAFERRERO, SERGIOPIRRI, Candido | - |
| Furnace annealing effects in the formation of titanium silicide Schottky barriers / Barbarini, E., Guastella, S.A., Pirri, C.. - STAMPA. - (2010), pp. 119-122. (IEEE RTP, Proceedings of the 18th IEEE Conference on Advanced Thermal Processing of Semiconductors Gainesville (USA) Sept. 28 2010-Oct. 1 2010) [10.1109/RTP.2010.5623793]. | 1-gen-2010 | BARBARINI, ELENAGUASTELLA, SALVATORE ANTONIOPIRRI, Candido | - |
| Structural and chemical analysis of self-aligned titanium silicide formed by furnace annealing / Barbarini, E., Guastella, S.A., Pirri, C.. - ELETTRONICO. - (2010), pp. 333-336. (IEEE ASDAM 2010, 8th International Conference on Advanced Semiconductor Devices & Microsystems Smolenice (Slovakia) 25-27 Oct. 2010) [10.1109/ASDAM.2010.5666357]. | 1-gen-2010 | BARBARINI, ELENAGUASTELLA, SALVATORE ANTONIOPIRRI, Candido | - |