statistiche ricercatore

Continente	#
AS - Asia	803
EU - Europa	721
NA - Nord America	664
SA - Sud America	51
Continente sconosciuto - Info sul continente non disponibili	49
AF - Africa	4
Totale	2.292

Nazione	#
US - Stati Uniti d'America	642
IT - Italia	364
SG - Singapore	225
VN - Vietnam	214
CN - Cina	141
RU - Federazione Russa	117
FR - Francia	107
HK - Hong Kong	56
KR - Corea	45
BR - Brasile	40
BD - Bangladesh	31
DE - Germania	28
IN - India	26
BE - Belgio	22
GB - Regno Unito	18
FI - Finlandia	15
IE - Irlanda	15
IL - Israele	14
AT - Austria	13
CA - Canada	12
ID - Indonesia	11
NL - Olanda	9
TR - Turchia	9
JO - Giordania	6
JP - Giappone	6
PH - Filippine	5
AR - Argentina	4
TH - Thailandia	4
TW - Taiwan	4
CH - Svizzera	3
JM - Giamaica	3
CO - Colombia	2
EC - Ecuador	2
PL - Polonia	2
AL - Albania	1
CL - Cile	1
CR - Costa Rica	1
DK - Danimarca	1
DZ - Algeria	1
ES - Italia	1
GD - Grenada	1
GE - Georgia	1
GT - Guatemala	1
IQ - Iraq	1
KE - Kenya	1
MX - Messico	1
MY - Malesia	1
NO - Norvegia	1
PA - Panama	1
PK - Pakistan	1
PR - Porto Rico	1
PT - Portogallo	1
QA - Qatar	1
RS - Serbia	1
SA - Arabia Saudita	1
SE - Svezia	1
SK - Slovacchia (Repubblica Slovacca)	1
SN - Senegal	1
SV - El Salvador	1
TN - Tunisia	1
UY - Uruguay	1
VE - Venezuela	1
Totale	2.243

Nome	#
A System-Level Test Methodology for Communication Peripherals in System-on-Chips	283
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip	245
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level	228
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips	224
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip	220
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs	213
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults	205
Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs	199
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests	195
FSWGEN: a Device-tree Specification driven System-Level Test workload generator	127
Manufacturing and In-Field Testing Techniques	103
Advances in Testing and Reliability Benchmarks	29
A Multi-Phase Diagnostic Flow Combining Scan-Based Refinement and Targeted Functional Tests for Automotive SoCs	21
Totale	2.292

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2021/2022	28	0	0	0	0	0	0	0	0	0	0	23	5
2022/2023	117	2	9	16	5	11	12	26	3	11	1	12	9
2023/2024	142	35	14	11	8	10	20	15	8	3	4	9	5
2024/2025	437	1	29	4	46	45	57	24	45	50	27	30	79
2025/2026	1.323	51	43	59	109	68	61	150	142	256	190	45	149
2026/2027	245	42	117	85	1	0	0	0	0	0	0	0	0
Totale													2.292

PORTO @ Archivio Istituzionale della Ricerca