BERNARDI, PAOLO
 Distribuzione geografica
Continente #
NA - Nord America 665
EU - Europa 628
AS - Asia 576
SA - Sud America 11
OC - Oceania 9
AF - Africa 8
Totale 1897
Nazione #
US - Stati Uniti d'America 637
CN - Cina 382
IT - Italia 270
DE - Germania 106
IN - India 62
FR - Francia 45
IE - Irlanda 42
GB - Regno Unito 41
IR - Iran 24
CA - Canada 23
NL - Olanda 21
CZ - Repubblica Ceca 20
KR - Corea 19
RU - Federazione Russa 19
TW - Taiwan 19
JP - Giappone 17
BR - Brasile 8
UA - Ucraina 8
ES - Italia 7
GR - Grecia 7
MY - Malesia 7
HK - Hong Kong 6
AT - Austria 5
AU - Australia 5
EU - Europa 5
IL - Israele 5
ZA - Sudafrica 5
AP - ???statistics.table.value.countryCode.AP??? 4
CH - Svizzera 4
ID - Indonesia 4
NZ - Nuova Zelanda 4
PH - Filippine 4
PL - Polonia 4
QA - Qatar 4
VN - Vietnam 4
DK - Danimarca 3
MX - Messico 3
PK - Pakistan 3
RO - Romania 3
BE - Belgio 2
CO - Colombia 2
EE - Estonia 2
FI - Finlandia 2
KE - Kenya 2
LK - Sri Lanka 2
NO - Norvegia 2
PS - Palestinian Territory 2
PT - Portogallo 2
SA - Arabia Saudita 2
SE - Svezia 2
SG - Singapore 2
SI - Slovenia 2
SK - Slovacchia (Repubblica Slovacca) 2
TR - Turchia 2
UZ - Uzbekistan 2
VI - Stati Uniti Isole Vergini 2
AR - Argentina 1
EG - Egitto 1
HU - Ungheria 1
TH - Thailandia 1
Totale 1897
Città #
Beijing 165
Hangzhou 99
Turin 94
Kansas City 84
Houston 73
Ashburn 53
Seattle 44
Dublin 42
Torino 42
Ann Arbor 41
Shenzhen 40
Fairfield 33
Santa Cruz 30
San Ramon 26
Mountain View 19
Höst 18
Cambridge 15
Southend 14
Woodbridge 14
Shanghai 13
Buffalo 11
Bengaluru 10
Ürümqi 10
Fleming Island 9
Ottawa 9
Stuttgart 9
Toronto 9
Bangalore 8
Carignano 8
Guangzhou 8
Ludhiana 8
Milan 8
San Diego 8
Wilmington 8
Bremen 7
Rome 7
Southampton 7
Taipei 7
Amsterdam 6
Indore 6
Ingolstadt 6
Lake Forest 6
Los Angeles 6
Norwalk 6
Wuhan 6
Barcelona 5
Naples 5
Shinagawa 5
University Park 5
Chicago 4
Desio 4
Doha 4
Duncan 4
Hsinchu 4
Nanjing 4
Nanning 4
Novara 4
San Donato Milanese 4
San Francisco 4
Vellore 4
Xiangtan 4
Xining 4
Aosta 3
Clearwater 3
Dallas 3
Denver 3
Figline Valdarno 3
Guwahati 3
Herndon 3
Ho Chi Minh City 3
Jakarta 3
Kowloon 3
London 3
Muizenberg 3
Multan 3
New York 3
San Jose 3
Seoul 3
Suceava 3
Tehran 3
Tokyo 3
Antibes 2
Arzignano 2
Atlanta 2
Austin 2
Baguio 2
Baotou 2
Begusarai 2
Bellevue 2
Best 2
Boardman 2
Boulder 2
Bukit Mertajam 2
Catford 2
Changchun 2
Chengdu 2
Chiba 2
Chongqing 2
Christchurch 2
Christiansted 2
Totale 1319
Nome #
Agri-Food Traceability Management using a RFID System with Privacy Protection, file e384c42d-f957-d4b2-e053-9f05fe0a1d67 774
Peak Power Estimation: A Case Study on CPU Cores, file e384c42e-20f6-d4b2-e053-9f05fe0a1d67 401
On-line functionally untestable fault identification in embedded processor cores, file e384c42e-20dc-d4b2-e053-9f05fe0a1d67 307
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers, file e384c42e-4c8f-d4b2-e053-9f05fe0a1d67 107
Scan-Chain Intra-Cell Aware Testing, file e384c42f-2eff-d4b2-e053-9f05fe0a1d67 99
An Optimized Test During Burn-In for Automotive SoC, file e384c42f-df54-d4b2-e053-9f05fe0a1d67 85
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures, file e384c433-f51b-d4b2-e053-9f05fe0a1d67 31
Innovative methods for Burn-In related Stress Metrics Computation, file e384c434-38c8-d4b2-e053-9f05fe0a1d67 19
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip, file 8ca85a99-2ac5-4a5b-962f-9164fb4fea5c 16
Test, Reliability and Functional Safety trends for Automotive System-on-Chip, file e384c434-7998-d4b2-e053-9f05fe0a1d67 16
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip, file e384c432-5c6f-d4b2-e053-9f05fe0a1d67 15
Parallel Multithread Analysis of Extremely Large Simulation Traces, file e384c434-d56b-d4b2-e053-9f05fe0a1d67 13
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures, file e384c433-dac9-d4b2-e053-9f05fe0a1d67 9
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip, file 59324709-1588-4fc8-8cbb-1bb8d7c7ccdd 5
Recent Trends and Perspectives on Defect-Oriented Testing, file 9f026920-2439-410b-b613-af7250a5fb72 5
An efficient strategy for the development of software test libraries for an automotive microcontroller family, file e384c432-a0c0-d4b2-e053-9f05fe0a1d67 5
Industrial best practice: cases of study by automotive chip- makers, file e384c434-2b3a-d4b2-e053-9f05fe0a1d67 5
An efficient strategy for the development of software test libraries for an automotive microcontroller family, file e384c432-b938-d4b2-e053-9f05fe0a1d67 4
Software-based self-test techniques of computational modules in dual issue embedded processors, file e384c42d-c926-d4b2-e053-9f05fe0a1d67 2
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors, file e384c42e-2f1f-d4b2-e053-9f05fe0a1d67 2
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test, file e384c430-f626-d4b2-e053-9f05fe0a1d67 2
Recent Trends and Perspectives on Defect-Oriented Testing, file 138d8101-4ed3-481a-8355-7c634e02664a 1
A novel SEU injection setup for Automotive SoC, file 7ba831d4-f8ac-47d7-8562-b92730ab80db 1
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip, file 86aa7109-84fe-4ecf-acc9-c9d1b8069e9d 1
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors, file e384c42e-28b2-d4b2-e053-9f05fe0a1d67 1
Microprocessor Testing: Functional Meets Structural Test, file e384c42f-7a38-d4b2-e053-9f05fe0a1d67 1
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors, file e384c42f-bcec-d4b2-e053-9f05fe0a1d67 1
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip, file e384c432-81b9-d4b2-e053-9f05fe0a1d67 1
An Optimized Test During Burn-In for Automotive SoC, file e384c432-edc1-d4b2-e053-9f05fe0a1d67 1
Scan-Chain Intra-Cell Aware Testing, file e384c433-24b2-d4b2-e053-9f05fe0a1d67 1
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers, file e384c433-3167-d4b2-e053-9f05fe0a1d67 1
A hybrid in-field self-test technique for SoCs, file e384c433-bfcc-d4b2-e053-9f05fe0a1d67 1
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors, file e384c433-d943-d4b2-e053-9f05fe0a1d67 1
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level, file f49e1cef-6125-47c3-b7f5-af53fd99c896 1
Totale 1935
Categoria #
all - tutte 3646
article - articoli 464
book - libri 0
conference - conferenze 3182
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 7292


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2017/201840 0000 00 00 240313
2018/201965 1234 32 11 2131815
2019/202099 12639 1111 118 105112
2020/2021123 710611 109 184 1412814
2021/2022322 13122268 519 4326 7124217
2022/2023210 14173925 2230 4011 12000
Totale 1935