Archivio Istituzionale della RicercaFABIANO, MICHELE
FABIANO, MICHELE
Dipartimento di Automatica Informatica (attivo dal 01/01/1900 al 31/12/2011)
023091
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
2012 Zambelli, C.; Indaco, Marco; Fabiano, Michele; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.
ADAGE: An Automated Synthesis tool for Adaptive BCH-based ECC IP-Cores
2012 DI CARLO, Stefano; Fabiano, Michele; Indaco, Marco; Prinetto, Paolo Ernesto
Automated synthesis of EDACs for FLASH Memories with User-Selectable Correction Capability
2010 Caramia, M.; Fabiano, Michele; Miele, A.; Piazza, R.; Prinetto, Paolo Ernesto
EDACs and test integration strategies for NAND flash memories
2010 DI CARLO, Stefano; Fabiano, Michele; Piazza, R.; Prinetto, Paolo Ernesto
Exploring Design Dimensions in Flash-based Mass-memory Devices
2009 Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
FLARE: A design environment for FLASH-based space applications
2009 Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
Flash-memories in Space Applications: Trends and Challenges
2009 Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories / Zambelli, C.; Indaco, Marco; Fabiano, Michele; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.. - ELETTRONICO. - (2012), pp. 881-886. ( Design, Automation and Test in Europe, Conference and Exhibition (DATE) Dresden, DE 12-16 March 2012) [10.1109/DATE.2012.6176622]. | 1-gen-2012 | INDACO, MARCOFABIANO, MICHELEDI CARLO, STEFANOPRINETTO, Paolo Ernesto + | 2012-DATE-Flash-AuthorVersion.pdf; 2012-DATE-Flash.pdf |
| ADAGE: An Automated Synthesis tool for Adaptive BCH-based ECC IP-Cores / DI CARLO, Stefano; Fabiano, Michele; Indaco, Marco; Prinetto, Paolo Ernesto. - ELETTRONICO. - (2012), pp. 15-15. ( ITC - IEEE International Test Conference Anaheim 4-9 November, 2012). | 1-gen-2012 | DI CARLO, STEFANOFABIANO, MICHELEINDACO, MARCOPRINETTO, Paolo Ernesto | 2012-ITC-Adage-AuthorVersion.pdf |
| Automated synthesis of EDACs for FLASH Memories with User-Selectable Correction Capability / Caramia, M.; Fabiano, Michele; Miele, A.; Piazza, R.; Prinetto, Paolo Ernesto. - ELETTRONICO. - (2010), pp. 113-120. ( HLDVT 2010: IEEE International High Level Design Validation and Test Workshop 2010 Anaheim, FL (USA) 10-12 June 2010) [10.1109/HLDVT.2010.5496653]. | 1-gen-2010 | FABIANO, MICHELEPRINETTO, Paolo Ernesto + | HLDVT2010_rel_008_camera_ready.pdf |
| EDACs and test integration strategies for NAND flash memories / DI CARLO, Stefano; Fabiano, Michele; Piazza, R.; Prinetto, Paolo Ernesto. - ELETTRONICO. - (2010), pp. 218-221. ( IEEE East-West Design & Test Symposium (EWDTS) St. Petersburg, RU 17-20 Sept. 2010) [10.1109/EWDTS.2010.5742060]. | 1-gen-2010 | DI CARLO, STEFANOFABIANO, MICHELEPRINETTO, Paolo Ernesto + | 2010-EWDTS-Edac.pdf |
| Exploring Design Dimensions in Flash-based Mass-memory Devices / Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto. - STAMPA. - (2009), pp. 43-48. ( ACM 4th International Workshop on Software Support for Portable Storage (IWSSPS) Grenoble, F 15 Oct. 2009). | 1-gen-2009 | DI CARLO, STEFANOFABIANO, MICHELEPRINETTO, Paolo Ernesto + | 2009-IWSSPS-Flash-AuthorVersion.pdf |
| FLARE: A design environment for FLASH-based space applications / Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto. - STAMPA. - (2009), pp. 14-19. ( IEEE International High Level Design Validation and Test Workshop (HLDVT) San Francisco (CA), USA 4-6 Nov. 2009) [10.1109/HLDVT.2009.5340180]. | 1-gen-2009 | DI CARLO, STEFANOFABIANO, MICHELEPRINETTO, Paolo Ernesto + | 2009-HLDVT-Flare-AuthorVersion.pdf; 2009-HLDVT-Flare.pdf |
| Flash-memories in Space Applications: Trends and Challenges / Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto. - STAMPA. - (2009), pp. 429-432. ( IEEE 7th East-West Design & Test Symposium (EWDTS) Moscow, RU 18-21 Sep. 2009). | 1-gen-2009 | DI CARLO, STEFANOFABIANO, MICHELEPRINETTO, Paolo Ernesto + | 2009-EWDTS-Flash.pdf; 2009-EWDTS-Flash-AuthorVersion.pdf |