Sfoglia per Serie  

Opzioni
Vai a: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Mostrati risultati da 1 a 5 di 5
Citazione Data di pubblicazione Autori File
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. 1-gen-2024 Turco V.Ruospo A.Sanchez E.Sonza Reorda M. Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf
Efficient Neural Network Approximation via Bayesian Reasoning / Savino, A.; Traiola, M.; Di Carlo, S.; Bosio, A.. - STAMPA. - (2021), pp. 45-50. (Intervento presentato al convegno 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021 tenutosi a Vienna, Austria nel 2027-9 April 20211) [10.1109/DDECS52668.2021.9417057]. 1-gen-2021 Savino A.Di Carlo S. + DDECS2021.pdfEfficient_Neural_Network_Approximation_via_Bayesian_Reasoning.pdf
HermesBDD: A Multi-Core and Multi-Platform Binary Decision Diagram Package / Capogrosso, L; Geretti, L; Cristani, M; Fummi, F; Villa, T. - (2023), pp. 87-90. (Intervento presentato al convegno 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (EST) nel May 3-5, 2023) [10.1109/DDECS57882.2023.10139480]. 1-gen-2023 Capogrosso, LFummi, FVilla, T + HermesBDD_A_Multi-Core_and_Multi-Platform_Binary_Decision_Diagram_Package.pdf
A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. 1-gen-2023 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf
Split-Et-Impera: A Framework for the Design of Distributed Deep Learning Applications / Capogrosso, L; Cunico, F; Lora, M; Cristani, M; Fummi, F; Quaglia, D. - ELETTRONICO. - (2023), pp. 39-44. (Intervento presentato al convegno 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (EST) nel May 3-5, 2023) [10.1109/DDECS57882.2023.10139711]. 1-gen-2023 Capogrosso, LFummi, FQuaglia, D + Split-Et-Impera_A_Framework_for_the_Design_of_Distributed_Deep_Learning_Applications.pdf
Mostrati risultati da 1 a 5 di 5
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile