Spectral and Allan deviation analyses of offset, drift and low-frequency noise cancellation schemes in measurements

This work analyses techniques and measuring schemes that cancel or reduce to acceptable levels the effects of offset, drift and low-frequency noise affecting a measuring system, which can significantly bias the measurement result, in a way suitable for metrological purposes and for the prediction of the measurement uncertainty. These techniques are often based on the modulation and demodulation of the measurand, according to specific patterns, such as AB, A0 or ABBA.