Archivio Istituzionale della RicercaThis paper presents a preliminary parametric modeling scheme for IC buffers, able to reproduce the dynamic behavior of port variables as a function of external parameters. The approach combines a NARX representation with kernel regression and is tested on the output current of a commercial buffer, with temperature as the external parameter. Preliminary results indicate that the proposed method is a promising solution for parameter-dependent dynamic modeling.
A Preliminary Study on Kernel Ridge Regression for Parametric Behavioral Modeling of IC Buffers / Yuldashev, D., Atlante, M., Stievano, I.S., Trinchero, R.. - ELETTRONICO. - (2026), pp. 1-4. (2026 IEEE 30th Workshop on Signal and Power Integrity (SPI) Torino (Ita) Jun 14-17, 2026) [10.1109/spi68887.2026.11594754].
A Preliminary Study on Kernel Ridge Regression for Parametric Behavioral Modeling of IC Buffers
Yuldashev, Dilyorjon;Atlante, Marco;Stievano, Igor S.;Trinchero, Riccardo
2026
Abstract
This paper presents a preliminary parametric modeling scheme for IC buffers, able to reproduce the dynamic behavior of port variables as a function of external parameters. The approach combines a NARX representation with kernel regression and is tested on the output current of a commercial buffer, with temperature as the external parameter. Preliminary results indicate that the proposed method is a promising solution for parameter-dependent dynamic modeling.
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cnf-2026-SPI-paramVVKRRt-ieee.pdf
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https://hdl.handle.net/11583/3013007