A DPI Test Bench that Relies on Time-Domain RF Measurements

The direct power injection method is a well established approach for evaluating the susceptibility of integrated circuits to radio frequency interference. It is widely used in the EMC qualification of ICs because, among the other, it provides the immunity level of each pin belonging to the device under test. This information is useful in module level EMC analysis as well as for the comparison with pin compatible ICs implementing the same functions.\\ This work presents a critical assessment of the DPI test method prescribed in IEC 62132-4 and presents a novel approach based on radio frequency measurements carried out in the time domain. The test bench equipped to validate the effectiveness of the proposed test procedure is presented referring to the susceptibility tests carried out on a commercial operational amplifier.