Experimental Characterization of the Traveling Wave Strength in Modulated Microstrip-Line-Based High Impedance Surface Through Infrared Thermography

Preliminary experimental results on the measurements of the electric field strength dissipation in a width-modulated microstrip line based periodic structure are presented and discussed. The measurements are carried out using infrared sensors, and allow instantaneous visualization of the temperature with a high spatial and temporal resolution. The non-invasive technique is useful, for example in evaluating surface impedance, special features included in the sample or even defects and imperfections occurring during manufacturing, that can change the electromagnetic performances of devices, based on manipulation of surface current density, as in cloaking or other critical applications.