This contribution presents a black-box approach based on Artificial Neural Networks (ANNs) for the accurate and computationally efficient non-linear modeling of microwave transistors. The presented model, here applied to a MESFET test-case, adopts a feed-forward ANN to relate the harmonic components of the device's incident and reflected port waves with arbitrary harmonic loading. As such, it is conceived to be exploited for non-linear design within RF CAD tools based on the Harmonic Balance approach. The detailed implementation within Keysight Advance Design System (ADS), resorting to built-in custom modeling features, is also presented along with model validation results, demonstrating the potential of the proposed approach for fully-black-box non-linear device modeling.

Non-linear Microwave Transistor Modeling through ANNs: a Frequency-domain CAD Implementation / Ramella, Chiara; Donati Guerrieri, Simona; Corbellini, Simone; Pirola, Marco. - (2025), pp. 1-3. (Intervento presentato al convegno 2025 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2025 tenutosi a Torino (Ita) nel 10-11 April 2025) [10.1109/inmmic64198.2025.10975578].

Non-linear Microwave Transistor Modeling through ANNs: a Frequency-domain CAD Implementation

Ramella, Chiara;Donati Guerrieri, Simona;Corbellini, Simone;Pirola, Marco
2025

Abstract

This contribution presents a black-box approach based on Artificial Neural Networks (ANNs) for the accurate and computationally efficient non-linear modeling of microwave transistors. The presented model, here applied to a MESFET test-case, adopts a feed-forward ANN to relate the harmonic components of the device's incident and reflected port waves with arbitrary harmonic loading. As such, it is conceived to be exploited for non-linear design within RF CAD tools based on the Harmonic Balance approach. The detailed implementation within Keysight Advance Design System (ADS), resorting to built-in custom modeling features, is also presented along with model validation results, demonstrating the potential of the proposed approach for fully-black-box non-linear device modeling.
2025
979-8-3315-1960-5
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/3004912