Archivio Istituzionale della RicercaThe Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.
Power converters for future LHC experiments / M., Alderighi; M., Citterio; M., Riva; S., Latorre; Costabeber, ; A., Paccagnella; F., Sichirollo; G., Spiazzi; M., Stellini; P., Tenti; P., Cova; N., Delmonte; A., Lanza; M., Bernardoni; R., Menozzi; S., Baccaro; Iannuzzo, Francesco; Sanseverino, Annunziata; Busatto, Giovanni; DE LUCA, Valentina; Velardi, Francesco. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 7:3(2012), pp. 1-15. [10.1088/1748-0221/7/03/C03012]
Power converters for future LHC experiments
IANNUZZO, Francesco;
2012
Abstract
The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.
| File | Dimensione | Formato | |
|---|---|---|---|
|
1748-0221_7_03_C03012.pdf
accesso riservato
Tipologia:
2a Post-print versione editoriale / Version of Record
Licenza:
Non Pubblico - Accesso privato/ristretto
Dimensione
707.92 kB
Formato
Adobe PDF
|
707.92 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/3000757