Archivio Istituzionale della RicercaThe Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.
A time-resolved IBICC experiment using the IEEM of the SIRAD facility / L., Silvestrin; D., Bisello; Busatto, Giovanni; P., Giubilato; Iannuzzo, Francesco; S., Mattiazzo; D., Pantano; Sanseverino, Annunziata; M., Tessaro; Velardi, Francesco; Wyss, Jeffery. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 273:(2012), pp. 234-236. [10.1016/j.nimb.2011.07.083]
A time-resolved IBICC experiment using the IEEM of the SIRAD facility
IANNUZZO, Francesco;
2012
Abstract
The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.
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Time_resolved_IBICC.pdf
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https://hdl.handle.net/11583/3000746