We present a three-dimensional (3D) multiphysics model that examines how increasing input optical power degrades the electro-optical frequency response performance of lateral Ge-on-Si waveguide photodetectors. Our approach combines finite-difference time-domain (FDTD) simulations and drift-diffusion modeling to capture both optical and electrical behaviors. Simulation results show that once the input power exceeds a few mW, the detector bandwidth is significantly reduced due to electric-field screening effects.
Effects of input optical power in lateral Ge-on-Si waveguide photodetectors: a 3D multiphysics modeling study / Alasio, Matteo G.; Divincenzo, Giuseppe; Vallone, Marco; Bertazzi, Francesco; Gioannini, Mariangela; Goano, Michele. - ELETTRONICO. - 13370:(2025), pp. 1-3. (Intervento presentato al convegno SPIE Photonics West - OPTO 2025 tenutosi a San Francisco (USA) nel 25-31 January 2025) [10.1117/12.3043556].
Effects of input optical power in lateral Ge-on-Si waveguide photodetectors: a 3D multiphysics modeling study
Alasio, Matteo G.;Divincenzo, Giuseppe;Vallone, Marco;Bertazzi, Francesco;Gioannini, Mariangela;Goano, Michele
2025
Abstract
We present a three-dimensional (3D) multiphysics model that examines how increasing input optical power degrades the electro-optical frequency response performance of lateral Ge-on-Si waveguide photodetectors. Our approach combines finite-difference time-domain (FDTD) simulations and drift-diffusion modeling to capture both optical and electrical behaviors. Simulation results show that once the input power exceeds a few mW, the detector bandwidth is significantly reduced due to electric-field screening effects.| File | Dimensione | Formato | |
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https://hdl.handle.net/11583/2999930
			
		
	
	
	
			      	