Archivio Istituzionale della RicercaWe experimentally and theoretically characterize multimode elliptical VCSELs. Relative Intensity Noise spectra reveal spurious peaks and optical spectra show four-wave-mixing sidebands limiting the performance. We explain, for the first time, these nontrivial characteristics, drawing guidelines for designing VCSELs with low RIN over the modulation bandwidth.
Relative Intensity Noise and Four Wave Mixing in Multimode Elliptical Oxide Aperture VCSELs / Rimoldi, C.; Novarese, Marco; Columbo, L. L.; Tibaldi, A.; Debernardi, Pierluigi; García, S. Romero; Raabe, C.; Gioannini, M.. - ELETTRONICO. - (2024), pp. 1-2. (Intervento presentato al convegno 29th International Semiconductor Laser Conference (ISLC) tenutosi a Orlando, FL (USA) nel 29 September 2024 - 02 October 2024) [10.1109/islc57752.2024.10717342].
Relative Intensity Noise and Four Wave Mixing in Multimode Elliptical Oxide Aperture VCSELs
Rimoldi, C.;Novarese, Marco;Columbo, L. L.;Tibaldi, A.;Gioannini, M.
2024
Abstract
We experimentally and theoretically characterize multimode elliptical VCSELs. Relative Intensity Noise spectra reveal spurious peaks and optical spectra show four-wave-mixing sidebands limiting the performance. We explain, for the first time, these nontrivial characteristics, drawing guidelines for designing VCSELs with low RIN over the modulation bandwidth.
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https://hdl.handle.net/11583/2994058