In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.
Anisotropic complex refractive indices of atomically thin materials: Determination of the optical constants of few-layer black phosphorus / Ross, A. M.; Paterno, G. M.; Dal Conte, S.; Scotognella, F.; Cinquanta, E.. - In: MATERIALS. - ISSN 1996-1944. - 13:24(2020), pp. 1-12. [10.3390/ma13245736]
Anisotropic complex refractive indices of atomically thin materials: Determination of the optical constants of few-layer black phosphorus
Scotognella F.;
2020
Abstract
In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.File | Dimensione | Formato | |
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https://hdl.handle.net/11583/2985630