Avalanche photodetectors (APDs) are a crucial technology for detection of weak optical signals. These devices operate on internal gain, meaning only the device currents, including the optical signal, are amplified [1] . This allows high performance APDs to maximize their signal-to-noise ratio as long as the excess noise due to the amplification process remains low. In this work, we investigate how slight geometric changes to a device design due to variabilities in the fabrication process can affect the performance of an APD. The performance metrics considered are gain, excess noise factor, and bandwidth.

Impact of Fabrication Variabilities on Performance of Avalanche Photodetectors / Zhu, Mike; Alasio, Matteo; Bellotti, Enrico. - ELETTRONICO. - (2023), pp. 109-110. (Intervento presentato al convegno 23rd International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD 2023) tenutosi a Torino, Italy nel 18-21 September 2023) [10.1109/NUSOD59562.2023.10273530].

Impact of Fabrication Variabilities on Performance of Avalanche Photodetectors

Alasio, Matteo;
2023

Abstract

Avalanche photodetectors (APDs) are a crucial technology for detection of weak optical signals. These devices operate on internal gain, meaning only the device currents, including the optical signal, are amplified [1] . This allows high performance APDs to maximize their signal-to-noise ratio as long as the excess noise due to the amplification process remains low. In this work, we investigate how slight geometric changes to a device design due to variabilities in the fabrication process can affect the performance of an APD. The performance metrics considered are gain, excess noise factor, and bandwidth.
2023
979-8-3503-1429-8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2983018