In mid- and far-infrared HgCdTe photodetectors, the maximum operating temperature is determined by the dark current, which in turn depends on charge carriers lifetimes. The ability to reduce dark current and operate at the radiative limit allows for significantly higher operating temperature, but in this new scenario some approximations, commonly and historically applied in the literature to estimate and optimize lifetimes and dark current, in some cases should be avoided.

Different approximations for carriers lifetimes in HgCdTe quasi-neutral regions / Vallone, M.; Alasio, M. G. C.; Tibaldi, A.; Bertazzi, F.; Hanna, S.; Eich, D.; Wegmann, A.; Figgemeier, H.; Ghione, Giovanni.; Goano, M.. - ELETTRONICO. - (2023), pp. 25-26. (Intervento presentato al convegno 23rd International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD 2023) tenutosi a Turin, Italy nel 18 - 21 September 2023) [10.1109/NUSOD59562.2023.10273472].

Different approximations for carriers lifetimes in HgCdTe quasi-neutral regions

Vallone, M.;Alasio, M. G. C.;Tibaldi, A.;Bertazzi, F.;Ghione, Giovanni.;Goano, M.
2023

Abstract

In mid- and far-infrared HgCdTe photodetectors, the maximum operating temperature is determined by the dark current, which in turn depends on charge carriers lifetimes. The ability to reduce dark current and operate at the radiative limit allows for significantly higher operating temperature, but in this new scenario some approximations, commonly and historically applied in the literature to estimate and optimize lifetimes and dark current, in some cases should be avoided.
2023
979-8-3503-1429-8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2982937