Archivio Istituzionale della RicercaIn this paper, the susceptibility to electromagnetic interference (EMI) of a battery management system (BMS) used in electric vehicles is addressed. In particular, the effects of EMI on the BMS vertical interface (VIF), i.e., the galvanically isolated data link between different BMS modules are analyzed by transistor-level simulations with reference to direct power injection (DPI) and bulk current injection (BCI) test conditions for the first time. Based on the simulations, the DPI and BCI susceptibility levels of two different VIF architectures are estimated, and different failure mechanisms are highlighted.
Simulation Analysis of the Bit Error Induced by EMI on Galvanically Isolated Data-Link Embedded in an Automotive Battery Management IC / Ahmadi, Amirhossein; Bendotti, Valerio; Serratoni, Claudio; Crovetti, Paolo S.. - ELETTRONICO. - (2023). (Intervento presentato al convegno ICEAA 2023 International Conference on Electromagnetics in Advanced Applications tenutosi a Venice (Italy) nel 09-13 October 2023) [10.1109/ICEAA57318.2023.10297892].
Simulation Analysis of the Bit Error Induced by EMI on Galvanically Isolated Data-Link Embedded in an Automotive Battery Management IC
Amirhossein Ahmadi;Paolo S. Crovetti
2023
Abstract
In this paper, the susceptibility to electromagnetic interference (EMI) of a battery management system (BMS) used in electric vehicles is addressed. In particular, the effects of EMI on the BMS vertical interface (VIF), i.e., the galvanically isolated data link between different BMS modules are analyzed by transistor-level simulations with reference to direct power injection (DPI) and bulk current injection (BCI) test conditions for the first time. Based on the simulations, the DPI and BCI susceptibility levels of two different VIF architectures are estimated, and different failure mechanisms are highlighted.
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https://hdl.handle.net/11583/2982321