The series connection of insulated gate devices (IGBTs and MOSFETs) is treated with reference to different approaches which ensure a balanced voltage sharing. Both load-side and gate-side techniques are discussed, and their merits and demerits are highlighted. A novel approach, which intervenes during the rise time or fall time of the collector voltages, is discussed and compared to the alternative solutions. Laboratory tests on two IGBT devices are carried out according to the analyzed techniques. Finally, the disadvantages of the multiple connections are discussed in terms of switching speed reduction and power loss increase.

On the series connection of insulated gate power devices / Belverde, G.; Galluzzo, A.; Melito, M.; Musumeci, S.; Raciti, A.. - (2000). (Intervento presentato al convegno IEEE International Caracas Conference on Devices, Circuits and Systems tenutosi a Cancun, Mexico nel 17-17 March 2000) [10.1109/ICCDCS.2000.869865].

On the series connection of insulated gate power devices

S. Musumeci;
2000

Abstract

The series connection of insulated gate devices (IGBTs and MOSFETs) is treated with reference to different approaches which ensure a balanced voltage sharing. Both load-side and gate-side techniques are discussed, and their merits and demerits are highlighted. A novel approach, which intervenes during the rise time or fall time of the collector voltages, is discussed and compared to the alternative solutions. Laboratory tests on two IGBT devices are carried out according to the analyzed techniques. Finally, the disadvantages of the multiple connections are discussed in terms of switching speed reduction and power loss increase.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2980016