Instrumented Indentation Test allows thorough surface multi-scale mechanical characterisation by depth-sensing the indenter penetration and correlating it with the indenter-sample contact area and the applied force. Localised plastic phenomena at the indentation edge, i.e. pile-up and sink-in, may bias the characterisation results. Current approaches attempt correcting related systematic errors by numerical simulation and AFM-based techniques. However, they require careful tuning and complex and expensive experimental procedures. This work proposes a methodology based on in-situ Electric Contact Resistance which augments information on the contact area and allows edge effect correction. The methodology is demonstrated and validated on industrially relevant metallic materials.

Improvement of instrumented indentation test accuracy by data augmentation with electrical contact resistance / Galetto, M.; Kholkhujaev, J.; Maculotti, G.. - In: CIRP ANNALS. - ISSN 0007-8506. - ELETTRONICO. - 72:1(2023), pp. 469-472. [10.1016/j.cirp.2023.03.034]

Improvement of instrumented indentation test accuracy by data augmentation with electrical contact resistance

Galetto M.;Kholkhujaev J.;Maculotti G.
2023

Abstract

Instrumented Indentation Test allows thorough surface multi-scale mechanical characterisation by depth-sensing the indenter penetration and correlating it with the indenter-sample contact area and the applied force. Localised plastic phenomena at the indentation edge, i.e. pile-up and sink-in, may bias the characterisation results. Current approaches attempt correcting related systematic errors by numerical simulation and AFM-based techniques. However, they require careful tuning and complex and expensive experimental procedures. This work proposes a methodology based on in-situ Electric Contact Resistance which augments information on the contact area and allows edge effect correction. The methodology is demonstrated and validated on industrially relevant metallic materials.
2023
File in questo prodotto:
File Dimensione Formato  
1-s2.0-S0007850623000379-main.pdf

accesso aperto

Tipologia: 2a Post-print versione editoriale / Version of Record
Licenza: Creative commons
Dimensione 993.37 kB
Formato Adobe PDF
993.37 kB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2979082