Archivio Istituzionale della Ricercahis work studies the reliability of a FreeRTOS operating system when affected by Single Event Upset faults. The methodology is based on fault injection to target the most relevant variables and data structures. Results confirm the selectivity in the OS fault tolerance, paving the way to a tailored design of fault-tolerant mechanisms, such as selective hardening of the OS.
Reliability assessment of FreeRTOS in Embedded Systems / Bosio, A.; Rebaudengo, M.; Savino, A.. - ELETTRONICO. - (2022), pp. 28-30. (Intervento presentato al convegno 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks tenutosi a Baltimore, MD (USA) nel 27-30 June 2022) [10.1109/DSN-S54099.2022.00019].
Reliability assessment of FreeRTOS in Embedded Systems
Rebaudengo M.;Savino A.
2022
Abstract
his work studies the reliability of a FreeRTOS operating system when affected by Single Event Upset faults. The methodology is based on fault injection to target the most relevant variables and data structures. Results confirm the selectivity in the OS fault tolerance, paving the way to a tailored design of fault-tolerant mechanisms, such as selective hardening of the OS.
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https://hdl.handle.net/11583/2971557