Static and Dynamic Nonlinear Effects in Silicon Micro-Rings: Impact of Trap Assisted Shockley Read Hall Carrier Recombination

We present a new model for the analysis of non-linear effects in silicon micro-ring resonators based on the Shockley Read Hall model for carrier recombination in the silicon core. We can reproduce both measured ring transmission spectra varying input power and measured ring oscillating regimes. We report also pump-probe experiments for extracting the recovery dynamics of the effective loss and refractive index change.