Detecting metrologically useful asymmetry and entanglement by a few local measurements

Zhang, C.; Yadin, B.; Hou, Z. -B.; Cao, H.; Liu, B. -H.; Huang, Y. -F.; Maity, R.; Vedral, V.; C. -F., Li; Guo, G. -C.; Girolami, D.

doi:10.1103/PhysRevA.96.042327

Important properties of a quantum system are not directly measurable, but they can be disclosed by how fast the system changes under controlled perturbations. In particular, asymmetry and entanglement can be verified by reconstructing the state of a quantum system. Yet, this usually requires experimental and computational resources which increase exponentially with the system size. Here we show how to detect metrologically useful asymmetry and entanglement by a limited number of measurements. This is achieved by studying how they affect the speed of evolution of a system under a unitary transformation. We show that the speed of multiqubit systems can be evaluated by measuring a set of local observables, providing exponential advantage with respect to state tomography. Indeed, the presented method requires neither the knowledge of the state and the parameter-encoding Hamiltonian nor global measurements performed on all the constituent subsystems. We implement the detection scheme in an all-optical experiment.

Detecting metrologically useful asymmetry and entanglement by a few local measurements / Zhang, C.; Yadin, B.; Hou, Z. -B.; Cao, H.; Liu, B. -H.; Huang, Y. -F.; Maity, R.; Vedral, V.; Li, C. -F.; Guo, G. -C.; Girolami, D.. - In: PHYSICAL REVIEW A. - ISSN 2469-9926. - 96:4(2017), p. 042327. [10.1103/PhysRevA.96.042327]

Titolo:	Detecting metrologically useful asymmetry and entanglement by a few local measurements
Autori:	Zhang C. Yadin B. Hou Z. -B. Cao H. Liu B. -H. Huang Y. -F. Maity R. VEDRAL, VLATKO Li C. -F. Guo G. -C. GIROLAMI, DAVIDE mostra contributor esterni nascondi contributor esterni
Data di pubblicazione:	2017
Rivista:	PHYSICAL REVIEW A
Digital Object Identifier (DOI):	http://dx.doi.org/10.1103/PhysRevA.96.042327
Appare nelle tipologie:	1.1 Articolo in rivista

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