PORTO @ 
Archivio Istituzionale della Ricerca
IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.
EnglishThis work discusses the design of a 2-stacked cell at 36 GHz, analyzing the large discrepancies found between circuit-level and electro-magnetic (EM) simulations due to crosstalk (gate power leakage). At millimeter-wave frequencies, EM optimization of the inter-stage matching is crucial, however, its layout compactness poses several issues on the selection of the EM set-up, thus simulations reliability was put in doubt. To dispel this doubt the cell was fabricated and tested, demonstrating the effectiveness of EM predictions and the actual presence of gate power leakage. This required a deep re-design of the cell, currently on-going, based on a completely different inter-stage matching approach.
Electro-magnetic Crosstalk Effects in a Millimeter-wave MMIC Stacked Cell / Ramella, Chiara; Piacibello, Anna; Camarchia, Vittorio; Pirola, Marco. - ELETTRONICO. - (2020), pp. 1-3. ((Intervento presentato al convegno 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC) tenutosi a Cardiff, UK nel 16-17 July 2020.
Scheda prodotto non validato
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo
| Titolo: | Electro-magnetic Crosstalk Effects in a Millimeter-wave MMIC Stacked Cell |
| Autori: | |
| Data di pubblicazione: | 2020 |
| Abstract: | This work discusses the design of a 2-stacked cell at 36 GHz, analyzing the large discrepancies f...ound between circuit-level and electro-magnetic (EM) simulations due to crosstalk (gate power leakage). At millimeter-wave frequencies, EM optimization of the inter-stage matching is crucial, however, its layout compactness poses several issues on the selection of the EM set-up, thus simulations reliability was put in doubt. To dispel this doubt the cell was fabricated and tested, demonstrating the effectiveness of EM predictions and the actual presence of gate power leakage. This required a deep re-design of the cell, currently on-going, based on a completely different inter-stage matching approach. |
| ISBN: | 978-1-7281-2645-6 |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| StackedCellMeas_vA.pdf | post-print autore | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
| 09160341.pdf | post-print editoriale | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11583/2842646
Copyright © 2020