Application of a near field method to reducing conducted emissions

In order for an electronic device to be compliant with international standards and to be validated for mass production, it has to pass a series of Electromagnetic Compatibility (EMC) tests, one of which being the assessment of conducted emissions (CE). This work is intended to assist the engineers working in the EMC automotive area in the mitigation of CE levels in order to reduce the number of tests necessary in semi-anechoic chambers. We present results obtained in a shielded enclosure (standardized conducted emissions test) in comparison with a near-field scanning technique. The results prove consistency. The novelty of this approach stems from the correlation between near-field data and conducted emissions.