Electroluminescence (EL) is a non-destructive technique, which detects the most common defects in Photovoltaic (PV) modules. High resolution EL images are generally obtained by infrared-sensitive cameras equipped with different semiconductors (indium gallium arsenide or silicon sensors). In the present work, a procedure is proposed to build and set up a high resolution EL camera for crystalline Si modules, equipped with a low-cost Si sensor. It can be used to perform EL test both indoor (lab) and outdoor (on-field). Experimental results from real PV plant highlight the combined use of I-V curves and EL images, for determining the amount of power losses and their causes.
Realization and Use of an IR Camera for Laboratory and On-field Electroluminescence Inspections of Silicon Photovoltaic Modules / Ciocia, A.; Carullo, A.; DI Leo, P.; Malgaroli, G.; Spertino, F.. - ELETTRONICO. - (2019), pp. 2734-2739. ((Intervento presentato al convegno 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 tenutosi a USA nel 2019 [10.1109/PVSC40753.2019.8980711].
Titolo: | Realization and Use of an IR Camera for Laboratory and On-field Electroluminescence Inspections of Silicon Photovoltaic Modules | |
Autori: | ||
Data di pubblicazione: | 2019 | |
Serie: | ||
Abstract: | Electroluminescence (EL) is a non-destructive technique, which detects the most common defects in... Photovoltaic (PV) modules. High resolution EL images are generally obtained by infrared-sensitive cameras equipped with different semiconductors (indium gallium arsenide or silicon sensors). In the present work, a procedure is proposed to build and set up a high resolution EL camera for crystalline Si modules, equipped with a low-cost Si sensor. It can be used to perform EL test both indoor (lab) and outdoor (on-field). Experimental results from real PV plant highlight the combined use of I-V curves and EL images, for determining the amount of power losses and their causes. | |
ISBN: | 978-1-7281-0494-2 | |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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http://hdl.handle.net/11583/2805442