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EnglishBy applying a recently proposed coupled-Bloch-mode approach, we have derived the resonance condition for the longitudinal modes of passive photonic crystal (PhC) line-defect cavities. We have derived simple expressions for the electric field depending on the size of the cavity and the order of the resonant mode. We have shown that, as the cavity becomes longer, the fundamental mode turns from FP-like to DFB-like and the fraction of its wavevector components within the light cone is gradually suppressed. Importantly, we have clarified the physical origin for this behaviour.
Resonance condition and field distribution in line-defect photonic crystal cavities / Saldutti, Marco; Mørk, Jesper; Gioannini, Mariangela. - PROCEEDINGS VOLUME 11301(2020), p. 30. ((Intervento presentato al convegno Novel In-Plane Semiconductor Lasers XIX, SPIE OPTO, 2020, San Francisco, California, United States tenutosi a San Francisco, California, United States [10.1117/12.2545149].
| Titolo: | Resonance condition and field distribution in line-defect photonic crystal cavities | |
| Autori: | ||
| Data di pubblicazione: | 2020 | |
| Abstract: | By applying a recently proposed coupled-Bloch-mode approach, we have derived the resonance condit...ion for the longitudinal modes of passive photonic crystal (PhC) line-defect cavities. We have derived simple expressions for the electric field depending on the size of the cavity and the order of the resonant mode. We have shown that, as the cavity becomes longer, the fundamental mode turns from FP-like to DFB-like and the fraction of its wavevector components within the light cone is gradually suppressed. Importantly, we have clarified the physical origin for this behaviour. | |
| ISBN: | 9781510633650 9781510633667 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| SPIEproceeding2020.pdf | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia | |
| MS_SPIEproceeding_FINAL.pdf | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
http://hdl.handle.net/11583/2798792
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