While the plasmonic nature of graphene at terahertz frequencies has been widely reported, investigations on the practical utility of graphene at the microwave frequencies are sparse. In this paper, an ink comprising graphene thick films of different concentrations (12.5 wt.%, 25 wt.% and 33 wt.%) is prepared for deposition, by screen printing. Detailed investigation of the surface morphology of the films using Scanning Electron Microscope (SEM) and Atomic Force Microscopy (AFM) reveals that the graphene films present a homogeneous dispersion of the filler with a comparatively lower surface roughness at higher concentrations, and negligible agglomerates. The films are then printed in between copper electrodes on FR-4 substrate, commonly used in RF circuits, and the measured scattering parameters analyzed.
Experimental Characterization of Graphene Thick Films / Miscuglio, Mario; Quaranta, Simone; Bayat, Ahmad; Savi, Patrizia. - ELETTRONICO. - (2018), pp. 1-4. (Intervento presentato al convegno IEEE 38th International Conference on Electronics and Nanotechnology, ELNANO-2018 tenutosi a Kyiv, Ukraine nel April, 24-26).
Experimental Characterization of Graphene Thick Films
Mario Miscuglio;Ahmad Bayat;Patrizia Savi
2018
Abstract
While the plasmonic nature of graphene at terahertz frequencies has been widely reported, investigations on the practical utility of graphene at the microwave frequencies are sparse. In this paper, an ink comprising graphene thick films of different concentrations (12.5 wt.%, 25 wt.% and 33 wt.%) is prepared for deposition, by screen printing. Detailed investigation of the surface morphology of the films using Scanning Electron Microscope (SEM) and Atomic Force Microscopy (AFM) reveals that the graphene films present a homogeneous dispersion of the filler with a comparatively lower surface roughness at higher concentrations, and negligible agglomerates. The films are then printed in between copper electrodes on FR-4 substrate, commonly used in RF circuits, and the measured scattering parameters analyzed.Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2706331
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo