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EnglishTesting is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating test cost and duration include moving significant parts of the test hardware on-chip. This paper presents a novel low-overhead approach for design for test and built-in self-test of analog and mixed-mode blocks, derived from the oscillation-based test framework. The latter is enhanced by the use of complex oscillation regimes, improving fault coverage and enabling forms of parametric or specification-based testing. This technique, initially proposed targeting large subsystems such as A/D converters, is here illustrated at a much finer granularity, considering its application to analog-filter stages, and also proving its suitability to backfit existing designs. The simple case of a switched-capacitor second-order bandpass stage is used for illustration discussing how deviations from nominal gain, central frequency, and quality factor can be detected from measurements not requiring A/D stages. A sample design is validated by simulations run at the layout level, including Monte Carlo analysis and simulations based on random fault injections
Complex oscillation-based test and its application to analog filters / Callegari, S.; Pareschi, F.; Setti, G.; Soma, M.. - In: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS. - ISSN 1549-8328. - STAMPA. - 57:5(2010), pp. 956-969. [10.1109/TCSI.2010.2046956]
| Titolo: | Complex oscillation-based test and its application to analog filters | |
| Autori: | ||
| Data di pubblicazione: | 2010 | |
| Rivista: | ||
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1109/TCSI.2010.2046956 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| TCASICOBT.pdf | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11583/2696636
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