As faster Random Number Generators become available, the possibility to improve the accuracy of randomness tests through the analysis of a larger number of generated bits increases. In this paper we first introduce a high-performance true-random number generator designed by authors, which use a set of discrete-time piecewise-linear chaotic maps as its entropy source. Then, we present by means of suitably improved randomness tests, the validation of this generator and the comparison with other high-end solutions. We consider the NIST test suite SP 800-22 and we show that, as suggested by NIST itself, to increase the so-called power of the test, a more in-depth analysis should be performed using the outcomes of the suite over many generated sequences. With this approach we build a framework for RNG high quality testing, with which we are able to show that the designed prototype has a comparable quality with respect to the other high-quality commercial solutions, with a working speed that is one order of magnitude faster.
Statistical testing of a Chaos based CMOS true-random number generator / Pareschi, F.; Setti, G.; Rovatti, R.. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - STAMPA. - 19:4(2010), pp. 897-910. [10.1142/S0218126610006517]
|Titolo:||Statistical testing of a Chaos based CMOS true-random number generator|
|Data di pubblicazione:||2010|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1142/S0218126610006517|
|Appare nelle tipologie:||1.1 Articolo in rivista|