We present here an efficient numerical approach for the concurrent evaluation of the small-change deterministic device parameters and of the relevant Green’s functions exploited in the simulation of device small-signal (SS), small-signal large-signal (SSLS conversion matrix), stationary and cyclostationary noise, and variability properties of semiconductor devices through the solution of physics-based models based on a partial-differential equation description of charged carrier transport. The proposed technique guarantees a significant advantage in computation time with respect to the currently implemented solutions. The accuracy is the same as for the standard technique.
Concurrent Efficient Evaluation of Small-Change Parameters and Green's Functions for TCAD Device Noise and Variability Analysis / DONATI GUERRIERI, Simona; Pirola, Marco; Bonani, Fabrizio. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - 64:3(2017), pp. 1261-1267. [10.1109/TED.2017.2651168]
Titolo: | Concurrent Efficient Evaluation of Small-Change Parameters and Green's Functions for TCAD Device Noise and Variability Analysis | |
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Data di pubblicazione: | 2017 | |
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Digital Object Identifier (DOI): | http://dx.doi.org/10.1109/TED.2017.2651168 | |
Appare nelle tipologie: | 1.1 Articolo in rivista |
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TED 17.pdf | Articolo principale | 2. Post-print / Author's Accepted Manuscript | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
pre.pdf | Post-print accettato articolo prioncipale | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
http://hdl.handle.net/11583/2665944