In this paper, a system level characterization setup for on-wafer microwave power amplifiers is presented. The arbitrary waveform generator carrier frequency limitations are overcome by the insertion of an upconversion system. Linearity tests are performed to assess the validity of the proposed solution. A simple on-wafer calibration method for absolute power determination is developed, allowing for accurate average power and efficiency measurement in presence of modulated signals. A characterization and predistortion example on a backhaul 7 GHz Doherty power amplifier is carried out, highlighting the capabilities of the proposed setup.
Frequency extension of system level characterization and predistortion setup for on-wafer microwave power amplifiers / Quaglia, Roberto; Jiang, Tao; Camarchia, Vittorio. - STAMPA. - Unico:(2014), pp. 1432-1435. (Intervento presentato al convegno European Microwave Conference (EuMC), 2014 44th tenutosi a Roma nel 6-9 Oct. 2014) [10.1109/EuMC.2014.6986715].
Frequency extension of system level characterization and predistortion setup for on-wafer microwave power amplifiers
QUAGLIA, ROBERTO;JIANG, TAO;CAMARCHIA, VITTORIO
2014
Abstract
In this paper, a system level characterization setup for on-wafer microwave power amplifiers is presented. The arbitrary waveform generator carrier frequency limitations are overcome by the insertion of an upconversion system. Linearity tests are performed to assess the validity of the proposed solution. A simple on-wafer calibration method for absolute power determination is developed, allowing for accurate average power and efficiency measurement in presence of modulated signals. A characterization and predistortion example on a backhaul 7 GHz Doherty power amplifier is carried out, highlighting the capabilities of the proposed setup.Pubblicazioni consigliate
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https://hdl.handle.net/11583/2583141
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