Accuracy of Microwave Transistor fT and fMAX Extractions

We present a complete methodology to evaluate the accuracy of microwave transistor figures-of-merit fT (current gain cut-off frequency) and fMAX (maximum oscillation frequency). These figures-of-merit are usually extracted from calibrated S-parameter measurements affected by residual calibration and measurement uncertainties. Thus, the uncertainties associated to fT and fMAX can be evaluated only after an accurate computation of the S-parameters uncertainties, including the contribution from de-embedding. This was done with the aid of two recently released software tools. We also present an analysis on how different interpolation/extrapolation methodologies affect uncertainty. Finally, an overview of the possible causes of errors and suggestions on how to avoid them are given. With the continued rise of reported fT /fMAX values, this study has become necessary in order to add confidence intervals to these figures-of-merit.