PITCH FUNCTION COMPARISON METHODOLOGY FOR SUPPORTING A SMART 3D SCANNER SELECTION

When working with 3Dscanner devices, one of the most critical problems is usually the low quality of the point cloud provided by the scanning device. This problem mainly consists of the following two aspects. The first one is surely the choice of the strategy used to acquire the object shape. Most of the times, the selected strategy is based on selective sampling. This choice proved to be valid, especially when working with Free-Form surfaces: by using a selective sampling strategy is in fact possible to limit point density increase to those regions showing high morphological complexity. The second aspect is the difficulty of identifying which 3Dscanner device is the one that better fulfils the specific application needs, which vary depending on the specific scenario in which the costumer/user works (resolution, accuracy, …). As far as this last issue is concerned, the presence of many different acquisition technologies and devices on the market is a source of confusion for the users, who sometimes choose the wrong solution instead of finding the most efficient one. Hence, in order to support the potential users in their selection, this paper aims to propose a solution able to integrate the morphological analysis of the object acquired with the costumer needs (resolution, accuracy, …) and with the 3Dscanner performances in order to help users to identify the optimal solution.