Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.

Test Program Generation for Communication Peripherals in Processor-Based Systems-on-Chip / Apostolakis, A; Gizopoulos, D; Psarakis, M; Ravotto, Danilo; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - 26:2(2009), pp. 52-63. [10.1109/MDT.2009.43]

Test Program Generation for Communication Peripherals in Processor-Based Systems-on-Chip

RAVOTTO, DANILO;SONZA REORDA, Matteo
2009

Abstract

Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1855299
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