This paper describes the main features of the timedomain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, which aim to characterize the impedance behavior of transverse electromagnetic (TEM) and gigahertz TEM cells by means of a commercial VNA in time-domain mode, are presented.
Synthetic TDR Measurements for TEM and GTEM Cell Characterization / M., Borsero; G., Vizio; D., Parena; Teppati, Valeria. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 56:2(2007), pp. 271-274. [10.1109/TIM.2007.890796]
Synthetic TDR Measurements for TEM and GTEM Cell Characterization
TEPPATI, VALERIA
2007
Abstract
This paper describes the main features of the timedomain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, which aim to characterize the impedance behavior of transverse electromagnetic (TEM) and gigahertz TEM cells by means of a commercial VNA in time-domain mode, are presented.File | Dimensione | Formato | |
---|---|---|---|
IM_APRIL2007_II.pdf
accesso aperto
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
PUBBLICO - Tutti i diritti riservati
Dimensione
618.61 kB
Formato
Adobe PDF
|
618.61 kB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/1605471
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo