Archivio Istituzionale della RicercaThis paper addresses the development of a temperature-dependent parametric macromodel for the output ports of a digital IC. The model parameters are estimated from port transient voltage and current waveforms by means of a simple and efficient procedure. The obtained models are implemented as SPICE subcircuits. They perform at an accuracy and efficiency level suitable for system-level SI and EMC simulations.
Temperature-Dependent Macromodels of Digital Device / Stievano, IGOR SIMONE; Maio, Ivano Adolfo; Canavero, Flavio. - (2003), pp. 321-326. (Intervento presentato al convegno 15th IEEE International Zurich Symposium on Electromagnetic Compatibility tenutosi a Zurich (Switzerland) nel Feb. 18-20, 2003).
Temperature-Dependent Macromodels of Digital Device
STIEVANO, IGOR SIMONE;MAIO, Ivano Adolfo;CANAVERO, Flavio
2003
Abstract
This paper addresses the development of a temperature-dependent parametric macromodel for the output ports of a digital IC. The model parameters are estimated from port transient voltage and current waveforms by means of a simple and efficient procedure. The obtained models are implemented as SPICE subcircuits. They perform at an accuracy and efficiency level suitable for system-level SI and EMC simulations.
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https://hdl.handle.net/11583/1418285
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