Archivio Istituzionale della RicercaThe refractive index distribution is a key parameter not only to characterize the technological process but also for any integrated optical simulator. In this paper we propose a new algorithm to reconstruct the refractive index profile from the near-field measurements. The technique is based on the matching of the measured intensity profile with a computed one, varying the maximum index change and the diffusion depth.
Characterization of ion exchanged waveguides from near field measurements / Pircalaboiu, D.; Motta, G.; Perrone, Guido; Montrosset, Ivo. - STAMPA. - 3405:(1998), pp. 873-876. (Intervento presentato al convegno ROMOPTO '97: Fifth Conference on Optics tenutosi a Bucharest, Romania nel 9-12 September, 1997) [10.1117/12.312678].
Characterization of ion exchanged waveguides from near field measurements
PERRONE, Guido;MONTROSSET, Ivo
1998
Abstract
The refractive index distribution is a key parameter not only to characterize the technological process but also for any integrated optical simulator. In this paper we propose a new algorithm to reconstruct the refractive index profile from the near-field measurements. The technique is based on the matching of the measured intensity profile with a computed one, varying the maximum index change and the diffusion depth.
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https://hdl.handle.net/11583/1416317
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