Archivio Istituzionale della RicercaAn exact method for computing the fault detection probability of pseudorandom patterns is presented. The method is based on the global difference function of the faults. Proper manipulation of the Boolean function of a circuit can lead to the fast computation of its exact full detectability profile, thus avoiding the computational burden of exhaustive simulation. This method, besides strongly outperforming exhaustive fault simulation, applies to real circuits, such as many of those in the ISCAS'85 and ISCAS'89 benchmark sets.
Computation of exact random pattern detection probability / Fahrat, H.; Lioy, Antonio; Poncino, Massimo. - (1993), pp. 26.7.1-26.7.4. (Intervento presentato al convegno CICC'93: IEEE Custom Integrated Circuits Conference tenutosi a San Diego, CA (USA) nel 09-12 May 1993) [10.1109/CICC.1993.590784].
Computation of exact random pattern detection probability
LIOY, ANTONIO;PONCINO, MASSIMO
1993
Abstract
An exact method for computing the fault detection probability of pseudorandom patterns is presented. The method is based on the global difference function of the faults. Proper manipulation of the Boolean function of a circuit can lead to the fast computation of its exact full detectability profile, thus avoiding the computational burden of exhaustive simulation. This method, besides strongly outperforming exhaustive fault simulation, applies to real circuits, such as many of those in the ISCAS'85 and ISCAS'89 benchmark sets.
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https://hdl.handle.net/11583/1415624
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