This paper addresses the development of accurate and efficient behavioral models of digital IC ports from measured transient responses. The proposed approach is based on the estimation of parametric models from port voltage and current waveforms. The modeling process is described and applied to the modeling of both input and output ports. Its feasibility is demonstrated on a real device from, actual measurements
Identification of models for digital integrated circuit ports from measured transient waveforms / Canavero, Flavio; Maio, Ivano Adolfo; Stievano, IGOR SIMONE. - STAMPA. - 2:(2001), pp. 790-793. (Intervento presentato al convegno 18th IEEE Instrumentation and Measurement Technology Conference tenutosi a Budapest (Hungary) nel May 21-23) [10.1109/IMTC.2001.928186].
Identification of models for digital integrated circuit ports from measured transient waveforms
CANAVERO, Flavio;MAIO, Ivano Adolfo;STIEVANO, IGOR SIMONE
2001
Abstract
This paper addresses the development of accurate and efficient behavioral models of digital IC ports from measured transient responses. The proposed approach is based on the estimation of parametric models from port voltage and current waveforms. The modeling process is described and applied to the modeling of both input and output ports. Its feasibility is demonstrated on a real device from, actual measurementsPubblicazioni consigliate
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https://hdl.handle.net/11583/1413682
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