Archivio Istituzionale della RicercaThis paper addresses the behavioral modeling of output ports of digital integrated circuits via the identification of nonlinear parametric models. The aim of the approach is to produce models for signal integrity (SI) simulation directly from the measured transient responses of the devices. The modeling process is thoroughly described and an experimental demonstration of its feasibility is given
Behavioral models of digital IC ports from measured transient waveforms / Stievano, IGOR SIMONE; Maio, Ivano Adolfo. - STAMPA. - (2000), pp. 211-214. (Intervento presentato al convegno Electrical Performance of Electronic Packaging, EPEP tenutosi a Scottsdale, AZ (USA) nel Oct. 23-25, 2000) [10.1109/EPEP.2000.895530].
Behavioral models of digital IC ports from measured transient waveforms
STIEVANO, IGOR SIMONE;MAIO, Ivano Adolfo
2000
Abstract
This paper addresses the behavioral modeling of output ports of digital integrated circuits via the identification of nonlinear parametric models. The aim of the approach is to produce models for signal integrity (SI) simulation directly from the measured transient responses of the devices. The modeling process is thoroughly described and an experimental demonstration of its feasibility is given
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https://hdl.handle.net/11583/1413673
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