This paper addresses the development of macromodels for input and output ports of a digital device. The proposed macromodels consist of parametric representations that can be obtained from port transient waveforms at the device ports via a well established procedure. The models are implementable as SPICE subcircuits and their accuracy and efficiency are verified by applying the approach to the characterization of transistor-level models of commercial devices.
|Titolo:||Parametric Macromodels of Digital I/O Ports|
|Data di pubblicazione:||2002|
|Digital Object Identifier (DOI):||10.1109/TADVP.2002.803260|
|Appare nelle tipologie:||1.1 Articolo in rivista|