LARBI, MOURAD
LARBI, MOURAD
Dipartimento di Elettronica e Telecomunicazioni
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Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices with a Large Number of Parameters
2019 Trinchero, R.; Larbi, M.; Torun, H. M.; Canavero, F. G.; Swaminathan, M.
Variability Impact of Many Design Parameters: The Case of a Realistic Electronic Link
2018 Larbi, Mourad; Stievano, IGOR SIMONE; Canavero, Flavio; Besnier, Philippe
Citazione | Data di pubblicazione | Autori | File |
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Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices with a Large Number of Parameters / Trinchero, R.; Larbi, M.; Torun, H. M.; Canavero, F. G.; Swaminathan, M.. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 7:(2019), pp. 4056-4066. [10.1109/ACCESS.2018.2888903] | 1-gen-2019 | Trinchero R.Larbi M.Canavero F. G. + | FINAL VERSION.pdf; 08584446.pdf |
Variability Impact of Many Design Parameters: The Case of a Realistic Electronic Link / Larbi, Mourad; Stievano, IGOR SIMONE; Canavero, Flavio; Besnier, Philippe. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 60:1(2018), pp. 34-41. [10.1109/TEMC.2017.2727961] | 1-gen-2018 | LARBI, MOURADSTIEVANO, IGOR SIMONECANAVERO, Flavio + | jnl-2018-TEMC-PC-ieee.pdf; jnl-2018-TEMC-PC.pdf |