CIMMINO, DAVIDE
 Distribuzione geografica
Continente #
EU - Europa 341
NA - Nord America 86
AS - Asia 66
Continente sconosciuto - Info sul continente non disponibili 16
AF - Africa 1
OC - Oceania 1
Totale 511
Nazione #
FR - Francia 147
IT - Italia 128
US - Stati Uniti d'America 86
DE - Germania 36
EU - Europa 16
KR - Corea 15
CN - Cina 12
HK - Hong Kong 12
NL - Olanda 9
JP - Giappone 8
GB - Regno Unito 7
SG - Singapore 5
TW - Taiwan 5
IE - Irlanda 3
PK - Pakistan 3
AT - Austria 2
CH - Svizzera 2
DK - Danimarca 2
IN - India 2
AU - Australia 1
ES - Italia 1
FI - Finlandia 1
IR - Iran 1
MY - Malesia 1
NO - Norvegia 1
PH - Filippine 1
PL - Polonia 1
RU - Federazione Russa 1
TG - Togo 1
VN - Vietnam 1
Totale 511
Città #
Rome 38
Duncan 30
Turin 20
Hamburg 17
Torino 15
Milan 13
Marseille 9
Amsterdam 7
Padova 7
Central 6
Chandler 5
San Antonio 5
Singapore 5
Basking Ridge 4
Berlin 4
Jinan 4
Andover 3
Boydton 3
Dallas 3
Dublin 3
Guangzhou 3
Karachi 3
Munich 3
Bawtry 2
Brescia 2
Des Moines 2
Frankfurt am Main 2
Fremont 2
Greensboro 2
Houston 2
Isola Della Scala 2
Roncofreddo 2
Round Rock 2
San Jose 2
Sannomaru 2
Tokyo 2
Vaiano Cremasco 2
Veitsbronn 2
Vienna 2
Waltham 2
Wilmington 2
Zurich 2
Ashburn 1
Bengaluru 1
Borehamwood 1
Bremen 1
Catania 1
Central District 1
Council Bluffs 1
Enschede 1
Halfweg 1
Helsinki 1
Iligan City 1
Ilsede 1
Ingolstadt 1
Lonate Pozzolo 1
Los Angeles 1
Manchester 1
Messina 1
Monza 1
Mugnano Di Napoli 1
Nanchang 1
New Delhi 1
Norwalk 1
Phoenix 1
Princeton 1
Roccavione 1
San Donato Milanese 1
San Mateo 1
Seberang Jaya 1
Seoul 1
Shenzhen 1
Stavanger 1
Stuttgart 1
Taipei 1
Wolverhampton 1
Totale 282
Nome #
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices, file e384c433-87d5-d4b2-e053-9f05fe0a1d67 166
High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances, file e384c432-dcd7-d4b2-e053-9f05fe0a1d67 89
Multilayer film passivation for enhanced reliability of power semiconductor devices, file e384c431-aa08-d4b2-e053-9f05fe0a1d67 87
Multilayer film passivation for enhanced reliability of power semiconductor devices, file e384c431-c5f3-d4b2-e053-9f05fe0a1d67 82
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices, file e384c430-dea5-d4b2-e053-9f05fe0a1d67 66
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices, file e384c433-89ef-d4b2-e053-9f05fe0a1d67 28
Totale 518
Categoria #
all - tutte 867
article - articoli 495
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.362


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202044 19 0 0 0 0 0 0 19 1 0 3 2
2020/202168 7 1 1 1 29 1 2 3 5 5 9 4
2021/2022125 10 14 7 9 6 14 22 9 10 5 8 11
2022/2023109 6 4 31 9 8 7 7 18 4 13 2 0
2023/2024172 0 0 0 0 1 0 2 137 1 28 3 0
Totale 518