Archivio Istituzionale della RicercaMEDVED, JUAN IGNACIO
MEDVED, JUAN IGNACIO
Dipartimento di Elettronica e Telecomunicazioni
105685
An international trilateral comparison among the newest generations of digital and Josephson impedance bridges
2025 Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca
Magnitude and phase calibration of lock-in amplifiers, and analysis of the noise response
2025 Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca
MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors
2025 Zucca, Mauro; Al-Zubaidi-R-Smith, Nawfal; Bartova, Lucie; Van Den Brom, Helko; Callegaro, Luca; Cultrera, Alessandro; Fast, Lars; Girimonte, Aldo; Hassanzadeh, Melika; Mariscotti, Andrea; Masouras, Athanasios; Medved, Juan; Musumeci, Salvatore; Nicol, Giovanna; Ouameur, Mohamed; Rietveld, Gert
QuAHMET: Quantum anomalous Hall effect materials and devices for metrology
2025 Callegaro, Luca; Marzano, Martina; Medved, Juan; Gould, Charles; Hoffmann, Johannes; Huang, Nathaniel; Kaneko, Nobu-Hisa; Kucera, Jan; Molenkamp, Laurens W.; Onbasli, Mehmet Cengiz; Ozbay, Aisha Gokce; Scherer, Hansjörg; Kumar, Susmit
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| An international trilateral comparison among the newest generations of digital and Josephson impedance bridges / Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 74:(2025), pp. 1-9. [10.1109/tim.2025.3541803] | 1-gen-2025 | Ortolano, MassimoMedved, Juan + | Ortolano2025_IEEETransInstrumMeas_74_1501009.pdf |
| Magnitude and phase calibration of lock-in amplifiers, and analysis of the noise response / Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 74:(2025), pp. 1-15. [10.1109/tim.2025.3553954] | 1-gen-2025 | Medved, JuanOrtolano, Massimo + | Cultrera2025_IEEETransInstrumMeas_74_1008515.pdf |
| MetSuperCap: Metrology for static and dynamic characterisation of supercapacitors / Zucca, Mauro; Al-Zubaidi-R-Smith, Nawfal; Bartova, Lucie; Van Den Brom, Helko; Callegaro, Luca; Cultrera, Alessandro; Fast, Lars; Girimonte, Aldo; Hassanzadeh, Melika; Mariscotti, Andrea; Masouras, Athanasios; Medved, Juan; Musumeci, Salvatore; Nicol, Giovanna; Ouameur, Mohamed; Rietveld, Gert. - In: MEASUREMENT. SENSORS. - ISSN 2665-9174. - (2025). [10.1016/j.measen.2024.101434] | 1-gen-2025 | Hassanzadeh, MelikaMedved, JuanMusumeci, Salvatore + | 2024_MetSuperCap Metrology for static and dynamic characterisation of supercapacitors_Zucca.pdf |
| QuAHMET: Quantum anomalous Hall effect materials and devices for metrology / Callegaro, Luca; Marzano, Martina; Medved, Juan; Gould, Charles; Hoffmann, Johannes; Huang, Nathaniel; Kaneko, Nobu-Hisa; Kucera, Jan; Molenkamp, Laurens W.; Onbasli, Mehmet Cengiz; Ozbay, Aisha Gokce; Scherer, Hansjörg; Kumar, Susmit. - In: MEASUREMENT. SENSORS. - ISSN 2665-9174. - (2025). [10.1016/j.measen.2024.101437] | 1-gen-2025 | Medved, Juan + | 2024_QuAHMET_Callegaro.pdf |