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A framework for integrating design optimization and manufacturability in electric vehicle production
2025 Favazza, Enrico; Borsato, Luca; Zhang, Jian; Simeone, Alessandro; Priarone, Paolo C.; Settineri, Luca
Online monitoring and correction method of threshold voltage in SiC MOSFET power cycling test
2022 Wu, Qiang; Kang, Jianlong; Chen, Yu; Zheng, Fujun; Zhang, Jian; Luo, Haoze; Li, Wuhua; Iannuzzo, Francesco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A framework for integrating design optimization and manufacturability in electric vehicle production / Favazza, Enrico; Borsato, Luca; Zhang, Jian; Simeone, Alessandro; Priarone, Paolo C.; Settineri, Luca. - ELETTRONICO. - 136:(2025), pp. 775-780. ( 35th CIRP Design Conference, CIRP Design 2025 Patras (Greece) 02-04 April 2025) [10.1016/j.procir.2025.08.132]. | 1-gen-2025 | Favazza, EnricoBorsato, LucaZhang, JianSimeone, AlessandroPriarone, Paolo C.Settineri, Luca | - |
| Online monitoring and correction method of threshold voltage in SiC MOSFET power cycling test / Wu, Qiang; Kang, Jianlong; Chen, Yu; Zheng, Fujun; Zhang, Jian; Luo, Haoze; Li, Wuhua; Iannuzzo, Francesco. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114702] | 1-gen-2022 | Jian ZhangFrancesco Iannuzzo + | File054.pdf; 1-s2.0-S0026271422002268-main.pdf |