Archivio Istituzionale della RicercaCICERO, GIANCARLO
CICERO, GIANCARLO
Dipartimento Scienza Applicata e Tecnologia
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Ab initio simulations of semiconductor surfaces and interfaces
2020 Calzolari, A.; Cicero, G.; Catellani, A.
Ab Initio DFT Simulations of Nanostructures
2012 Aliano, Antonio; Cicero, Giancarlo
Structural properties of water in confined geometries: an ab initio molecular dynamics description
2009 Cicero, Giancarlo; Galli, G.
Combined HREM and theoretical analysis of SiC/Si interfaces
2003 Grillo, V.; Frabboni, S.; Cicero, G.; Savini, G.; Catellani, A.
Micro-Raman characterization of mc-Si:H films deposited by PECVD, mc-SiC:H deposited by ECR-CVD and 6H-SiC wafers
2002 Ferrero, Sergio; Giorgis, Fabrizio; Pirri, Candido; Mandracci, Pietro; Cicero, Giancarlo; Ricciardi, Carlo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Ab initio simulations of semiconductor surfaces and interfaces / Calzolari, A.; Cicero, G.; Catellani, A. (SPRINGER HANDBOOKS). - In: Springer Handbook of Surface ScienceELETTRONICO. - [s.l] : Springer Science and Business Media Deutschland GmbH, 2020. - ISBN 978-3-030-46904-7. - pp. 119-153 [10.1007/978-3-030-46906-1_5] | 1-gen-2020 | Cicero G. + | - |
| Ab Initio DFT Simulations of Nanostructures / Aliano, Antonio; Cicero, Giancarlo. - STAMPA. - 1:(2012), pp. 1-8. [10.1007/978-94-017-9780-1] | 1-gen-2012 | ALIANO, ANTONIOCICERO, Giancarlo | - |
| Structural properties of water in confined geometries: an ab initio molecular dynamics description / Cicero, Giancarlo; Galli, G. - In: Quantum Chemical Calculations of Surfaces and Interfaces of MaterialsSTEVENSON RANCH : American Scientific Publisher, 2009. - ISBN 9781588831385. | 1-gen-2009 | CICERO, Giancarlo + | - |
| Combined HREM and theoretical analysis of SiC/Si interfaces / Grillo, V.; Frabboni, S.; Cicero, G.; Savini, G.; Catellani, A. - In: Microscopy of Semiconducting Materials 2003STAMPA. - [s.l] : CRC Press, 2003. - ISBN 9781351074636. - pp. 69-72 [10.1201/9781351074636] | 1-gen-2003 | Cicero G. + | - |
| Micro-Raman characterization of mc-Si:H films deposited by PECVD, mc-SiC:H deposited by ECR-CVD and 6H-SiC wafers / Ferrero, Sergio; Giorgis, Fabrizio; Pirri, Candido; Mandracci, Pietro; Cicero, Giancarlo; Ricciardi, Carlo - In: State of the Art and Future Development in Raman Spectroscopy and Related Techniques / G. MESSINA, S. SANTANGELO. - AMSTERDAM : IOS Press, 2002. - ISBN 9781586032623. - pp. 113-130 | 1-gen-2002 | FERRERO, SERGIOGIORGIS, FABRIZIOPIRRI, CandidoMANDRACCI, PietroCICERO, GiancarloRICCIARDI, Carlo | - |